AI for Advance Product Testing Forum | Day 3 | 22 May 2025, Thursday | 10:00 - 15:15hrs | L3 | Heliconia | 3410A - 3511
Artificial intelligence is transforming IC testing by enabling smarter, faster, and more cost-effective solutions. From AI-driven fault detection and diagnosis to predictive analytics for yield improvement, these advancements address the growing complexity of modern integrated circuits. By automating test processes and enhancing accuracy, AI-powered testing accelerates time-to-market while reducing costs. This forum explores the latest innovations and applications of AI in reshaping the future of IC testing.
Registration is open!
EARLY BIRD RATE | PUBLISHED RATE | STUDENT | ||
SEMI-Member | Non-Member | SEMI-Member | Non-Member | |
250 | 330 | 310 | 400 | 75 |
- All prices listed are in Singapore Dollars and subject to 9% GST, applicable only to Singapore-based companies for pre-registration.
- For on-site registration (subject to seats availability), a 9% GST will be applied, regardless of the company's location.
- Group purchases of 3 or more participants (in a single registration) will receive a 15% discount.
- Ticket purchased are strictly non-refundable and non-transferable.
- For HRD Corp claims (only for Malaysia attendees), please refer to the following links on the claiming matrix and guidelines:
Agenda
Session Chairs:
Dr. Jeffrey LAM
Adjunct Associate Professor, National University of Singapore | Chairman, SEMI Southeast Asia Advanced Product Testing Technical Committee, Singapore
Mr. Chak Huat YEO
Senior Director, GlobalFoundries | Vice-Chairman, SEMI Southeast Asia Advanced Product Testing Technical Committee, Singapore
| Time | Program |
|---|---|
| 10:00 - 10:05 hrs | Welcome and Introduction |
| 10:05 - 10:30 hrs | Ensuring Peak Performance in AI-Driven Edge Computing: A Comprehensive Look at Testing AI Chips for Functionality Mr. David FERGUSON, Corporate Vice President and Singapore Country Leader, AMD, Singapore |
| 10:30 - 10:55 hrs | Riding the Intelligent Test Wave Ms. Jian ZHANG, Vice President, Engineering, Qualcomm Semiconductor, Taiwan |
| 10:55 - 11:20 hrs | Optimizing Semiconductor Testing with AI and Digital Twin Technologies Mr. Don ONG, Director and Head of Innovation, Advantest Field Service Business Group, Advantest, Singapore |
| 11:20 - 11:30 hrs | Break & Networking |
| 11:30 - 11:55 hrs | Harnessing AI/ML in the Semiconductor Value Chain to Improve Yield Outcome Mr. Chak Huat YEO, Senior Director, GlobalFoundries | Vice-Chairman, SEMI Southeast Asia Advanced Product Testing Technical Committee, Singapore |
| 11:55 - 12:20 hrs | Next-Gen Testing for AI and HPC: Embracing High Parallelism and Test 2.0 Innovations Mr. Stuart PEARCE, Senior Director Test 2.0 Solutions, AEM Holdings, United States |
| 12:20 - 12:25 hrs | Presentation of Token of Appreciation |
| 12:25 - 13:25 hrs | Lunch & Networking |
| 13:25 - 13:50 hrs | Prediction Driven Test Solutions Mr. Song Yong NG, Director, Test Solutions Engineering - Non-Volatile Memory, Micron Semiconductor Asia Operations, Singapore |
| 13:50 - 14:15 hrs | AI/ML Applications Trends with Real-time Edge Analysis and Decision-Making Solution Ms. Angela HSIEH, Application Group Manager, Emerson, Taiwan |
| 14:15 - 14:40 hrs | Semiconductor Manufacturing Yield Prediction and Optimization Using Machine Learning Techniques Ms. Amanda FU, Product Test Engineering Director, Silicon Laboratories International, Singapore |
| 14:40 - 15:05 hrs | Staying Ahead - Memory Design & Test for AI, by AI Mr. Nirbhaya PATHAK, Senior Director, R&D Engineering, Memory Technology, Sandisk Storage, Malaysia |
| 15:05 - 15:15 hrs | Presentation of Token of Appreciation & Closing Remarks |
*Program subject to changes
Featured Speakers
Mr. Don ONG
Mr. Stuart PEARCE
Mr. David FERGUSON
Ms. Angela HSIEH
Mr. Chak Huat YEO
Mr. Song Yong NG
Ms. Jian ZHANG
Mr. Nirbhaya PATHAK
