Ms. Jian ZHANG
Vice President, Engineering, Qualcomm Semiconductor
Jian is a semiconductor industry veteran with over 30 years of experience in process technology development, foundry operations, and product engineering. As Vice President at Qualcomm, Jian leads the Product Development and Test Engineering (PDTE) in APAC, overseeing new product test development, characterization, deployment, and yield management. Jian also oversees the development of Qualcomm’s product engineering data management system.
Before joining Qualcomm, Jian was VP of technology at NXP, where Jian managed technology roadmap planning and execution for both in-house fabs and foundries, ensuring automotive quality standards. Jian has also held management positions at Global Foundries and Hewlett Packard. Jian holds a master’s and Bachelor’s Degree in Electrical Engineering from Purdue University.
Presentation Title
Riding the Intelligent Test Wave
Abstract
The AI revolution has arrived, promised to simplify knowledge acquisition, improve information dissemination, and accelerate the learning process using test data. This transformation encourages collaborative innovation, shifting from conventional static approaches to a more dynamic and flexible testing methodology. By incorporating AI task agents, test engineers can assign routine tasks, allowing them to concentrate on crafting effective and efficient testing content and overseeing the post-Si process. Adopting intelligent testing necessitates a strong data infrastructure, training engineers in data analytics, refining workflows, and fostering collaboration across different functions involving both staff and data. To fully leverage the advantages of AI in testing, skilled and adaptive engineers are essential.