Mr. Don ONG
Director and Head of Innovation, Advantest Field Service Business Group, Advantest Singapore
Mr. Don Ong, the Director and Head of Innovation for Advantest Field Service Business Group – a division of Advantest Inc, holds a Bachelor Degree in Electrical and Electronics Engineering from Nanyang Technological University (Singapore) and a Master’s of Studies from University of Cambridge (United Kingdom).
With over 20 years of experience in the semiconductor industry across Silicon Valley and Asia, Don has excelled in various roles encompassing program management, product development, application engineering and test engineering. His journey and global perspectives have provided him with valuable insights and expertise in driving innovation and contributing to the advancement of semiconductor technology.
Presentation Title
Optimizing Semiconductor Testing with AI and Digital Twin Technologies
Abstract
As semiconductor manufacturing progresses towards more advanced, smaller-scale nodes, the industry faces significant challenges including intricate advanced packaging, yield management complexities, and thermal issues. These evolving difficulties underscore the critical need for foundational Artificial Intelligence (AI) models, which require clean, accurate, and timely data to facilitate effective monitoring, precise control, and swift problem resolution. To effectively build and deploy these AI and Machine Learning (ML) models, seamless yet secure data sharing across the semiconductor ecosystem becomes indispensable, ensuring intellectual property remains protected while maximizing data utility.
To address these critical industry needs, innovative platforms such as real-time data infrastructures and digital twin technologies are emerging. These solutions support comprehensive data sharing beyond mere test results, encompassing test configurations, environmental conditions, and additional key parameters essential for developing optimized AI and ML models.
Specifically, platforms like ACS RTDI™ and ACS Gemini™ serve as key enablers for advanced data management and analysis. ACS RTDI™ facilitates real-time, secure, and seamless data sharing across the semiconductor ecosystem. Meanwhile, ACS Gemini™ provides digital twin capabilities that empower engineers and developers to rapidly build and deploy robust AI and ML solutions. Together, these platforms drive superior product testing, optimized operational control, and enhanced yield management, significantly accelerating problem-solving, streamlining testing processes, and reducing time-to-market.