Mr. CHEN Changqing
Deputy Director, GlobalFoundries
Dr Chen is working on semiconductor area 24 year, he has plenty of experience on product analysis, yield ramp up, and advanced test application in the yield analysis etc.
Presentation Title
Smarter Yield Ramp: Leveraging Advanced Testing and Dynamic Fault Isolation
This presentation is about Smarter Yield Ramp which Leverags Advanced Testing and Dynamic Fault Isolation in the analysis process.