Mr. Howard CHUA
Senior Director, Test Solution Engineering, Micron Singapore
Howard Chua is currently the Senior Director of Test Solution Engineering at Micron Technology, stationed in Singapore. In his current role, Howard is responsible for test flow development for all Micron non-volatile memory products from wafer, package to SSD.
Howard has spent 26 years in the semiconductor industry at Micron, his career domains during his tenure in Micron span across quality, manufacturing, data science and test engineering.
Howard received his bachelor’s degree in Electrical & Electronic Engineering from Nanyang Technological University in 1997.
Presentation Title
Advance fault detection on test equipment using A.I and Machine Learning
Abstract
Complexity of testing advance memory devices is causing a challenge to identify true equipment failures in a high-volume test manufacturing environment. The strong interaction between device marginality and equipment performance is posing a challenge on differentiating between true equipment failures vs devices failures. This presentation we will discuss on how we utilize the rich datasets coming from both the device under test and the test equipment, applied machine learning algorithms and A.I models on historical and new datasets to identify and predict true equipment failures vs device failures in a high-volume test manufacturing environment.