Dr. Szu Huat GOH - Advanced Product Testing Technical Committee Vice Chairman

Goh Szu Huat received his B.Eng. and Ph.D. degrees in Electrical and Computer Engineering from the National University of Singapore. He began his career at GLOBALFOUNDRIES, where he led a team responsible for failure diagnostics and the development of advanced cross-functional methodologies integrating design and test to enhance yield learning. At Qualcomm, he was responsible for yield management for advanced technologies and test development covering ATPG and MBIST structural testing, DRAM testing, and AC characterization. He is currently with Marvell, where he serves as the Custom Silicon test content owner.

Szu Huat is also actively involved in the semiconductor community. He has served in several leadership roles at the International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), including Technical Program Chair in 2016, General Co-Chair in 2017, and General Chair in 2018. He also serves as a co-editor of Electronic Device Failure Analysis, a magazine published by ASM International.