Dr. Martin Keim joined the Silicon Test Solutions group of Mentor Graphics in 2001, now a Siemens Business, where he is currently Engineering Director of the Memory Built-In Self-Test and Silicon Insight team. He is a secretary of the IEEE P1687.1 working group and past member of the IEEE 1687 working group. He was editor of the sixth edition of the Microelectronics Failure Analysis Desk Reference Manual, responsible for the test and diagnosis chapters. He is currently editor of the EDFA magazine. For several years, Dr. Keim has worked on the organizing committee of the International Symposium for Testing and Failure Analysis, for which he was General Chair in 2016. He holds several national and international patents and is author of many technical publications. He received a doctorate in Informatics from the Albert-Ludwigs University in Germany.