Product & System Level Testing Forum (5)

@My9-10, North Wing, Level 1A, MITEC Thursday, May 24
9:15am to 2:30pm


Thank you for your participation at SEMICON Southeast Asia 2018!

Hope the event was fruitful for your business matching, technical learning and networking!

We will see you next year 7-9 May 2019 in Kuala Lumpur again.

Post Show Report will be ready by end of June.

For inquiry, please contact Ms. Candice Lim at clim@semi.org or +65 6391 9518.

My9-10 (North Wing), Level 1A, MITEC | Thursday, May 24 | 9:15am to 2:30pm | Paid

Product & System Level Testing Forum

Theme: Smart and Robust Testing with Big Data Analytics Solutions

Synopsis: Fundamentally Product and System Testing is a process of decision making based on data. Large amounts of data are being analyzed and decisions are made base on the Product requirement. Such sophisticated decision making systems require the ability to use data in a smart way. Especially in this complicated IOT Era, where test items coverage is huge resulting in longer Test-time and higher cost. Another key element is Robustness. New Testing system is needed to withstand high current, high voltage and high usage for the current IOT Era product. Thus, companies that can master Smart Data and Robust test systems will have a strong competitive edge in the new breed of semiconductor product/system testing. Testing will gradually move from reactive mode to a predictive mode.




Session Chair:
Dr. Jeffrey LAM
Vice President, Product, Test & Failure Analysis (PTF) | GLOBALFOUNDRIES Singapore Pte Ltd, Singapore



Session Co-Chair:
Mr. TAN Chun Sheng (CS TAN)
Group Vice-President & General Manager | STMicroelectronics Sdn Bhd, Malaysia



* Program below subject to change without prior notice.


Kindly note only proceedings with explicit permission from the speakers are shared below and with only registered attendees of this forum. 


Big Data @ Test by Mr. Murad HUDDA, Infineon Technologies Asia Pacific Pte Ltd, Singapore

5G mmWave Future Testing Methodology at ATE level by Mr. TING Jia Wen, GLOBALFOUNDRIES Singapore Pte Ltd, Singapore & Mr. Adrian KWAN, Advantest America Inc, USA [Please contact Adrian.kwan@advantest.com]

Novel Ways of Using Data (Text and Images) from Intel’s Assembly and Test Factory (ATM) by Mr. Duncan LEE, Intel Products (M) Sdn Bhd, Malaysia


Advancing Semiconductor Industry with the Industrial Internet of Things by Mr. Gobinath Tamil VANAN, National Instruments, Malaysia


Testing the Next Generation Wireless & RF/uWave Devices by Mr. TEH Boon Poh, Keysight Technologies Sales (M) Sdn Bhd, Malaysia

Do you want to attend this session? Register for SEMICON SEA

Mr. Leslie KHOO
Principal Engineer
STMicroelectronics Sdn Bhd, Malaysia
Mr. ONG Ban Seng
Test Development Manager
STMicroelectronics Sdn Bhd, Malaysia
Mr. Murad HUDDA
Principal, Test Technology Innovation
Infineon Technologies Asia Pacific Pte Ltd, Singapore
Mr. TING Jia Wen
Manager, Test Development Engineering
GLOBALFOUNDRIES Singapore Pte Ltd, Singapore
Mr. Adrian KWAN
Business Development Manager
Advantest America Inc, USA
Mr. Gobinath Tamil VANAN
Field Marketing Engineer, Semiconductor Industry
National Instruments, Malaysia
Mr. TEH Boon Poh
Technical Consultant
Keysight Technologies Sales (M) Sdn Bhd, Malaysia
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