Theme: Internet-of-Things Impact on Semiconductor Testing
Synopsis: The evolution of Internet has given rise to quick access of data, transformed into useful info and then generate actions that affect our daily lives. The data are collected from “Things”, in the IoT sense, a variety of devices with wide spectrum of applications such as medical applications, artificial intelligence, automotive sensing and more, connecting to billions of devices.
To be able to handle these devices connected to the network, the transformation of 4G to 5G network would come faster than we can ever imagined. In the next generation of network, it would couple with many standards to address different needs.
As you examine closely, not only connectivity of the network would be complex, the system requirements such as CPU speed, power consumption, DFT and DSP, many of these devices would be ever demanding technologically and commercially to manufacture them.
In this forum, the speakers from the industrial leading companies would give the audience the insight, and address the challenges in test that we might face as we are transforming into a the era of the connected information.