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Product & System Level Testing Forum (5)

@My9-10, North Wing, Level 1A, MITEC Thursday, May 24
9:15am to 2:30pm

SEMICON SEA 2018 Technical Forums are fully claimable by Human Resources Development Fund (HRDF) !
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Forum Agenda Speakers' Profile & Abstract
(Files are subject to further updates)

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Rates
SEMI Member: USD90 / SGD120 / MYR360*
Non-Member: USD120 / SGD160 / MYR480*
Additional 15% discount off rates for group registration if you register 3 pax and above!
*MYR payment will be collected onsite and in cash only.

My9-10 (North Wing), Level 1A, MITEC | Thursday, May 24 | 9:15am to 2:30pm | Paid

Product & System Level Testing Forum

Theme: Smart and Robust Testing with Big Data Analytics Solutions

Synopsis: Fundamentally Product and System Testing is a process of decision making based on data. Large amounts of data are being analyzed and decisions are made base on the Product requirement. Such sophisticated decision making systems require the ability to use data in a smart way. Especially in this complicated IOT Era, where test items coverage is huge resulting in longer Test-time and higher cost. Another key element is Robustness. New Testing system is needed to withstand high current, high voltage and high usage for the current IOT Era product. Thus, companies that can master Smart Data and Robust test systems will have a strong competitive edge in the new breed of semiconductor product/system testing. Testing will gradually move from reactive mode to a predictive mode.

   

 

 

Session Chair:
Dr. Jeffrey LAM
Vice President, Product, Test & Failure Analysis (PTF) | GLOBALFOUNDRIES Singapore Pte Ltd, Singapore

   

 

Session Co-Chair:
Mr. TAN Chun Sheng (CS TAN)
Group Vice-President & General Manager | STMicroelectronics Sdn Bhd, Malaysia

Sponsors:

               

* Program below subject to change without prior notice.

Do you want to attend this session? Register for SEMICON SEA

Mr. Leslie KHOO
Principal Engineer
STMicroelectronics Sdn Bhd, Malaysia
Mr. ONG Ban Seng
Test Development Manager
STMicroelectronics Sdn Bhd, Malaysia
Mr. Murad HUDDA
Principal, Test Technology Innovation
Infineon Technologies Asia Pacific Pte Ltd, Singapore
Mr. TING Jia Wen
Manager, Test Development Engineering
GLOBALFOUNDRIES Singapore Pte Ltd, Singapore
Mr. Adrian KWAN
Business Development Manager
Advantest America Inc, USA
Mr. Gobinath Tamil VANAN
Field Marketing Engineer, Semiconductor Industry
National Instruments, Malaysia
Mr. TEH Boon Poh
Technical Consultant
Keysight Technologies Sales (M) Sdn Bhd, Malaysia
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