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SEMI Member: USD90 / SGD120 / MYR360*
Non-Member: USD120 / SGD160 / MYR480*
Additional 15% discount off rates for group registration if you register 3 pax and above!
*MYR payment will be collected onsite and in cash only.
My9-10 (North Wing), Level 1A, MITEC | Thursday, May 24 | 9:15am to 2:30pm | Paid
Product & System Level Testing Forum
Theme: Smart and Robust Testing with Big Data Analytics Solutions
Synopsis: Fundamentally Product and System Testing is a process of decision making based on data. Large amounts of data are being analyzed and decisions are made base on the Product requirement. Such sophisticated decision making systems require the ability to use data in a smart way. Especially in this complicated IOT Era, where test items coverage is huge resulting in longer Test-time and higher cost. Another key element is Robustness. New Testing system is needed to withstand high current, high voltage and high usage for the current IOT Era product. Thus, companies that can master Smart Data and Robust test systems will have a strong competitive edge in the new breed of semiconductor product/system testing. Testing will gradually move from reactive mode to a predictive mode.
* Program below subject to change without prior notice.